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DOCUMENTATION_FORMAT: Man_Made
SAMPLE_ID: none
MATERIAL_TYPE: Spectralon White Reference Panel
MATERIAL: Spectralon White Reference Panel
FORMULA: TBD
FORMULA_HTML: TBD
COLLECTION_LOCALITY: TBD
ORIGINAL_DONOR: Gregg Swayze
CURRENT_SAMPLE_LOCATION: USGS Denver Spectroscopy Lab
ULTIMATE_SAMPLE_LOCATION: USGS Denver Spectroscopy Lab
SAMPLE_DESCRIPTION:
Spectralon white reference panel purchased from Labsphere Inc. (North Sutton, New Hampshire, USA).
The absolute reflectance of Spectralon was derived using the procedure described in Clark and others (1990) for halon. In this procedure, the reflectance of Spectralon was measured relative to sulfur and ground aluminum.
Clark, R.N., King, T.V., Klejwa, M., Swayze, G.A., & Vergo, N. (1990). High spectral resolution reflectance spectroscopy of minerals. Journal of Geophysical Research: Solid Earth (1978–2012), 95(B8), 12653-12680. http://dx.doi.org/10.1029/JB095iB08p12653
END_SAMPLE_DESCRIPTION.
XRD_ANALYSIS:
END_XRD_ANALYSIS.
COMPOSITIONAL_ANALYSIS_TYPE: None # XRF, EPMA, ICP(Trace), WChem
COMPOSITION_TRACE: None
COMPOSITION_DISCUSSION:
END_COMPOSITION_DISCUSSION.
MICROSCOPIC_EXAMINATION:
END_MICROSCOPIC_EXAMINATION.
SPECTROSCOPIC_DISCUSSION:
END_SPECTROSCOPIC_DISCUSSION.
SPECTRAL_PURITY: 1a2_3_4_ # 1= 0.2-3, 2= 1.5-6, 3= 6-25, 4= 20-150 microns